MOSFET (Metal-Oxide Semiconductor Field Effect Transistor) is a common semiconductor device that uses electric field effects to control its current,and can be widely used in analog circuits and digital circuits.MOSFET can be made of silicon,and can also be made of graphene,carbon nanotubes and other materials,and it is a hot spot in the research of materials and devices.Mosfet testing parameters usually include input/output characteristic curve,threshold voltage VGS(th),leakage current IGSS,IDSS, breakdown voltage VDSS,low-frequency mutual conductance gm,output resistance RDS, etc. Common problems in mosfet test